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Generic Aluminum Nitride Carriers for Optoelectronic Applications

Note: These carriers are a non-stock item. Contact sales@cmc.ca to enquire about lead time and quantity.

CMC has developed generic aluminum nitride (AlN) carriers suitable for optoelectronic and microelectronic device testing. These carriers facilitate the testing and characterization of your chip, by providing:

  • High thermal conductivity and CTE matching for III-V semiconductors
  • RF-substrate for chip die bonding, wire bonding, and electrical/optical probing

There are two versions of the carriers. Both versions are sized so that they are compatible with packaging in 14-pin butterfly packages, and are probed in a typical standard Chip-On-Carrier (COC) test station.

Generic Laser Carrier:Six-pad carriers, suitable for epoxy or Au-Sn solder attach and wirebonding, for chip on carrier testing, DC to 2.5 GHz. Layout is optimized for semiconductor laser diode characterization.

Generic Optical Waveguide Carrier: Two-pad carriers, suitable for epoxy or Au-Sn solder attach and wirebonding, for chip on carrier testing, 50 Ohm GSG waveguide, DC to 2.5 GHz, optimized for fibre in/fibre out optical waveguide device testing.

Overview

These carriers are designed primarily for DC characterization. However, the layouts include 50-ohm co-planar GSG bias lines with 500-micron pitch. The laser carrier includes provision for inclusion of wire bonds to power up to six independent sections and accommodates a device with up to a 3 mm cavity length. The waveguide device is shorter, to allow optical fibre access to both input and output facets of a device with a 3 mm cavity length.

Applications

  • Photonic chip-on-carrier applications
  • Semiconductor laser testing
  • Optical waveguide device testing

Pricing

Contact sales@cmc.ca for a quote.

Support

CMC offers a chip-on-carrier test stage that is specifically tailored for the design of these carriers, which can also be fabricated/adapted for a client’s requirements. Log into our website to download a copy of our COC test stage manual. For technical support related to these products, contact MEMSNanoIntegration@cmc.ca.

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